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Company: Aidi Salam
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Date/Time:  10/29/25 17:58 GMT
 

Keysight B2987A Empowering Semiconductor Testing



Keysight B2987A: Precision Source/Measure Unit for Advanced Semiconductor Testing

Product Overview:

The Keysight B2987A is a high-performance source/measure unit (SMU) designed for advanced semiconductor testing applications. It combines precision measurement capabilities with versatile sourcing functions to provide a comprehensive solution for characterizing and testing semiconductor devices.

Features and Specifications:

High-Precision Measurement:
Voltage measurement: 100 nV resolution, 0.0025% accuracy
Current measurement: 100 pA resolution, 0.0025% accuracy
Versatile Sourcing:
Voltage source: ±21 V, 100 mA
Current source: ±100 mA, 21 V
Fast Settling Time: <100 µs
Low Noise: <100 µVrms
High-Speed Digitization: 1 MS/s
Intuitive User Interface: Graphical display and touch-screen operation

What\’s in the Box:

Keysight B2987A Precision Source/Measure Unit
Power cord
USB cable
Quick start guide

Benefits:

Accurate and Reliable Measurements: Enables precise characterization of semiconductor devices, ensuring accurate test results.
Versatile Sourcing Capabilities: Supports a wide range of testing scenarios, from device characterization to functional testing.
Fast and Efficient Testing: Minimizes test time with fast settling time and high-speed digitization.
Easy-to-Use Interface: Simplifies operation and reduces setup time.

Value to the Customer:

The Keysight B2987A provides a comprehensive solution for advanced semiconductor testing, offering:

Enhanced Device Characterization: Enables accurate and reliable characterization of semiconductor devices, leading to improved device design and performance.
Accelerated Test Time: Reduces test time through fast settling time and high-speed digitization, increasing productivity and efficiency.
* Simplified Operation: Intuitive user interface and touch-screen operation streamline setup and operation, saving time and effort.

Minimum Order: 1 pieces

Keysight B2987A Empowering Semiconductor Testing
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